Yazar "Erturk, Kadir" seçeneğine göre listele

Listeleniyor 1 - 3 / 3
  • Küçük Resim Yok
    Öğe
    Characterization of CdS films and CdS/Si heterojunctions prepared by ultrasonic spray pyrolysis and their response to light
    (Elsevier, 2020) Bilgin, Vildan; Sarıca, Emrah; Demirselcuk, Barbaros; Erturk, Kadir
    In this work CdS thin films were deposited onto glass and p-Si substrates by ultrasonically spraying of precursor solutions prepared in molarity ranging from 0.025 M, to 0.1 M. Structural investigations revealed that all films have hexagonal structure and mean crystallite size was found to be in the range of 18 nm-21 nm. On the other hand, CdS films exhibited 65-70% optical transmittance and band gap energy for all films was found to be about 2.42 eV. Electrical measurements of CdS/Si heterojunctions were carried out under both dark and illumination conditions. Calculated ideality factor and zero-bias barrier height ranged from 3.02 to 2.66 and 0.74 eV-0.78 eV according to TE theory whereas they ranged from 6.91 to 4.73 and 0.71 eV-0.74 eV according to Cheungs' method. Increase in reverse saturation current when heterojunctions were illuminated indicated that they have good sensitivity to solar light.
  • Küçük Resim Yok
    Öğe
    Investigation of structural, spectral, optical and nonlinear optical properties of nanocrystal CdS: Electrodeposition and quantum mechanical studies
    (Elsevier GmbH, 2021) Erturk, Kadir; Isik, Seref; Aras, Ömür; Kaya, Yunus
    Nanocrystalline CdS semiconductor was synthesized by electrodeposition technique, and characterized by X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscope (SEM), and FTIR spectroscopic methods. XRD analysis result showed that it is a hexagonal crystal structure. SEM micrographs showed that the CdS nanocrystal is homogeneously distributed on the surface. The roughness of the CdS thin films was measured by AFM. The presence of band in the FTIR spectrum at 558 cm−1 corresponds to the stretching of CdS. CdS nanocrystals were modeled separately and calculated in the Gaussian program. Structural, spectroscopic, and nonlinear optical (NLO) properties were investigated using the DFT/Lanl2dz and semi-empirical/pm6 level. Besides, by making energy calculations, Homo, Lumo, band gap, and total state density (TDOS) were calculated. The experimental band gap was measured at 2.40 eV, while this calculated for hexagonal and cubic structure as 2.21 and 2.01 eV with semiemprical/pm6 model, 2.44 and 2.25 eV with DFT/lanl2dz level.These results support that CdS nanostructures are crystallized in hexagonal structure. With this study, the obtaining of nano structured CdS films by electrodeposition method, their structural, optical and surface properties were experimentally examined, supported by theoretical calculations, and additionally NLO properties were investigated. It has been determined that the nanocrystals obtained are suitable material for optoelectronic applications.
  • Küçük Resim Yok
    Öğe
    Sol-gel derived ZnO:Sn thin films and fabrication of n-ZnO:Sn/p-Si heterostructure
    (Elsevier B.V., 2021) Sarıca, Emrah; Gunes, Ibrahim; Akyuz, Idris; Bilgin, Vildan; Erturk, Kadir
    In this work ZnO:Sn thin films were deposited onto glass and p-Si substrates by spin coating of prepared sols which contains different amounts of Zn(CH3COO)2·2H2O and SnCl2 (0, 5, 10 and 15%). Physical properties of ZnO films were examined as a function of SnCl2 in prepared sols. In addition to that, heterostructure examinations were also carried out by depositing all films on p-Si substrates as well. XRD studies revealed that all films have c-axis orientation with crystallite sizes between 38 and 47 nm. AFM and SEM images showed that morphology of the films remarkably deteriorated with the increase in amount of SnCl2 in sol. Optical transmittance and absorbance spectra showed that films have high transmittance and low absorbance in the visible region. Besides, optical band gap increased from 3.27 eV to 3.37 eV. Additional band gap energies were determined for 10% and 15% Sn doped ZnO films. Room temperature photoluminescence spectra for all films were deconvoluted for the evaluation of all emission bands and it was noted that incorporation of SnCl2 into sol led to enhancement of UV-blue emission bands and caused emission bands related to oxygen vacancies to diminish. Four-point-probe measurements revealed that electrical resistivity of ZnO:Sn films increased from 3.20 × 100 Ωcm to 2.82 × 104 Ωcm and diode ideality factor of Ag/ZnO:Sn/p-Si/Au heterostructure was calculated to be in the range of 2.14–4.59 while zero-bias barrier height is in the range of 0.63–0.78 eV.