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Yazar "Arik, E." seçeneğine göre listele

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    Detailed analysis of amplitude and slope diffraction coefficients for knife-edge structure in S-UTD-CH model
    (ASTES Publishers, 2017) Arik, E.; Tabakcıoğlu, Mehmet Barış
    In urban, rural and indoor applications, diffraction mechanism is very important to predict the field strength and calculate the coverage accurately. The diffraction mechanism takes place on NLOS (non-line-of-sight) cases like rooftop, vertex, corner, edge and sharp surfaces. S-UTD-CH model computes three type of electromagnetic wave incidence such as direct, reflected and diffracted waves, respectively. As obstacles in diffraction geometry are in the same or closer height, contribution of the diffraction mechanism is dominant. To predict the diffracted fields accurately, amplitude and slope diffraction coefficients and the derivative of these coefficients have to be taken correctly. In this paper, all the derivations about diffraction coefficients are made for knife edge type structures and extensive simulations are performed in order to analyze the amplitude and diffraction coefficients. In plane angle diffraction, contributions of amplitude and slope diffraction coefficient are maxima. © 2017 ASTES Publishers. All rights reserved.
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    A Tool: Coverage Mapping with Direct and Reflected Rays from Lossy and Lossless Surfaces
    (Ieee, 2019) Arik, E.; Tabakcıoğlu, Mehmet Barış
    Coverage mapping is very important to install high quality, reliable and time-efficient communication systems. In order to work properly, the threshold electric field strength and/or power have to be provided For high quality service, reliable and time-efficient systems direct, reflected, diffracted and refracted rays have to be determined and total electric field resulted from these rays calculated. In this paper, direct and reflected rays from lossy and lossless surfaces are determined by a program developed and some simulation results are given carried on developed program and FEKO software.

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