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dc.contributor.authorCinar, S.
dc.contributor.authorMenguc, E.C.
dc.contributor.authorAcır, Nurettin
dc.date.accessioned2021-03-20T20:26:53Z
dc.date.available2021-03-20T20:26:53Z
dc.date.issued2017
dc.identifier.isbn9781509023868
dc.identifier.urihttp://doi.org/10.1109/TIPTEKNO.2017.8238070
dc.identifier.urihttps://hdl.handle.net/20.500.12885/1317
dc.description2017 Medical Technologies National Conference, TIPTEKNO 2017 -- 12 October 2017 through 14 October 2017 -- -- 134046en_US
dc.description2-s2.0-85047751322en_US
dc.description.abstractOcular artefacts caused by eye movements can distort Electroencephalogram (EEG) recordings. It is important to obtain clean EEG signals in diagnosing and interpreting diseases. Meaningful EEG signals should not be distorted during the removal of artefacts. In this study, Independent Component Analysis and Artificial Neural Network were used together to remove ocular artefacts. The method was tested by using the real dataset. The Relative Error (RE) and Correlation Coefficient (CC) was used to test the performance of the method. Relative error = 0.227±0.229 and correlation coefficient = 0.941 ±0.088 was calculated in the performance analysis. According to the results, the proposed method is successful in removing ocular artefacts in EEG signals. © 2017 IEEE.en_US
dc.language.isoturen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartof2017 Medical Technologies National Conference, TIPTEKNO 2017en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectArtificial neural networken_US
dc.subjectIcaen_US
dc.subjectKurtosisen_US
dc.subjectRemoval of arefactsen_US
dc.titleAutomatic removal of ocular artefacts in EEG signal by using independent component analysis and artificial neural networken_US
dc.typeconferenceObjecten_US
dc.departmentBTÜ, Mühendislik ve Doğa Bilimleri Fakültesi, Elektrik Elektronik Mühendisliği Bölümüen_US
dc.authorid0000-0003-1186-3058en_US
dc.contributor.institutionauthorAcır, Nurettin
dc.identifier.doi10.1109/TIPTEKNO.2017.8238070en_US
dc.identifier.volume2017-Januaryen_US
dc.identifier.startpage1en_US
dc.identifier.endpage4en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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