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dc.contributor.authorYılmaz, Alper
dc.contributor.authorBayrak, Gökay
dc.date.accessioned2021-03-20T20:26:51Z
dc.date.available2021-03-20T20:26:51Z
dc.date.issued2020
dc.identifier.isbn9781728172064
dc.identifier.urihttp://doi.org/10.1109/SIU49456.2020.9302431
dc.identifier.urihttps://hdl.handle.net/20.500.12885/1287
dc.description28th Signal Processing and Communications Applications Conference, SIU 2020 -- 5 October 2020 through 7 October 2020 -- -- 166413en_US
dc.description2-s2.0-85100306917en_US
dc.description.abstractIn this study, it is aimed to image the transparent objects by applying the phase shifting technique to lateral shearing digital holographic microscopy. In order to extract the phase information from interference patterns obtained by phase shifting technique, a hologram with 4 different phase values is created using quarter wave and half wave plates. In conventional lateral shearing digital holographic microscopy, duplicate images are formed due to the interference between two sheared object beams and information overlap occurs. The aim is to eliminate this problem by shifting the phase. Thus, the noise-free image is reconstructed without the need for any special signal processing algorithm or filter design. In this study, the images obtained with the conventional method and the proposed system are presented in 3 dimension. By comparing these two images, it is proved that the result is successfully achieved with the proposed system. © 2020 IEEE.en_US
dc.language.isoturen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartof2020 28th Signal Processing and Communications Applications Conference, SIU 2020 - Proceedingsen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectdigital holographic microscopyen_US
dc.subjectlateral shearingen_US
dc.subjectphase shiftingen_US
dc.subjecttransparent object.en_US
dc.titleDWT-Based Islanding Detection Method for DFIG-typed WTsen_US
dc.title.alternativeCBAG Kullanan Ruzgar Turbinlerinde Ada Mod Calmann ADD Yontemi ile Tespitien_US
dc.typeconferenceObjecten_US
dc.departmentBTÜ, Mühendislik ve Doğa Bilimleri Fakültesi, Elektrik Elektronik Mühendisliği Bölümüen_US
dc.authorid0000-0003-3736-3668en_US
dc.contributor.institutionauthorYılmaz, Alper
dc.identifier.doi10.1109/SIU49456.2020.9302431en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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